Electrical Test

E6NanoFab is equipped with 3 current and capacitance measurement tools to meet the needs of most wafer testing applications

Overview

IV and CV measurement for electronic devices.

Features

  • The maximum Current: 100 mA.
  • The maximum Voltage: 40 V.
  • The smallest pad that can probe: 30 um X 30 um.
Location
E6-03-02

Contact
Koo Chee Keong
Email: cheekeong-koo@nus.edu.sg
Tel: 651 61568

Overivew

IV and CV measurement for electronic devices.

Features

  • The maximum Current: 100 mA.
  • The maximum Voltage: 40 V.
  • The smallest pad that can probe: 20 um X 20 um.
Location
E6-03-02

Contact
Koo Chee Keong
Email: cheekeong-koo@nus.edu.sg
Tel: 651 61568

Overview

Provides for semiconductor device characterization and analysis at ambient environment.

Capabilities

Accommodate up to 4″ diameter samples. It has four adjustable needle probes for testing devices and circuits on wafers. Outboard electronics may include C-V measurement, current or voltage sources.

Location
E6-03-02

Contact
Koo Chee Keong
Email: cheekeong-koo@nus.edu.sg
Tel: 651 61568

Overview

The Agilent Semiconductor parameter analyzer (SPA) conducts standard test routines for p-n junctions, CMOS, MOSFET, diodes and etc.

Location
E6-03-02
Level 3 Metrology

Contact
Koo Chee Keong
Email: cheekeong-koo@nus.edu.sg
Tel: 651 61568